Analysis and Simulation of Heterostructure Devices
By Vassil Palankovski, R. Quay. 2004
202 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/eb2781bc94e5b8cfd30be99f92245696d0f1ff1c
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In Atomic and Molecular Physics, and Optics
In Electrical and Electronic Engineering
Citations in the corpus
- High-temperature modeling of AlGaN/GaN HEMTs (2009, methodology): “The low-field mobility is modeled by an expression similar to that proposed by Caughey and Thomas [45,16]: lLI ¼ lmin þ l L lmin 1þ CI=Cref c0 : CI denotes the concentration of ionized impurities, lL is the mobility in undoped material, lmin is the mobility in highly doped material, limited by impur”