Surface potential profiling and contact resistance measurements on operating pentacene thin-film transistors by Kelvin probe force microscopy

By K. Puntambekar, Paul V. Pesavento, C. Daniel Frisbie. 2003

281 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/e9cd0ef1f177a2700cca1c43734e7b0b8d272c6d