Analytical potential for atomistic simulations of silicon, carbon, and silicon carbide
By Paul Erhart, K. Albe. 2005
609 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/e9a13ba660085ee79031868854557f1b9d72a2a1
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Electrical and Electronic Engineering
- Gerry Byrne
- A. Kovalchenko
- G. Cross
- Alexander Stukowski
- Hans Nørgaard Hansen
- Yuebin B. Guo
- Saurav Goel
- Fengzhou Fang
In Materials Chemistry
- Saurav Goel
- A. Kovalchenko
- G. Cross
- H. Tetlow
- Dimitri D. Vvedensky
- Alexander Stukowski
- Hans Nørgaard Hansen
- Ian J. Ford
Citations in the corpus
- Molecular dynamics simulation study of deformation mechanisms in 3C-SiC during nanometric cutting at elevated temperatures (2016, neutral): “4 bond order potential (ABOP) [12] and Tersoff potential [13].”
- Growth of Epitaxial Graphene: Theory and Experiment (2014, result): “Different results were obtained in [331]: using a modified Tersoff potential [374] it was found that graphene formed after annealing to between 1200 and 1260 K even when a single Si layer was removed.”
- Influence of microstructure on the cutting behaviour of silicon (2016, methodology): “Abbreviations: ABOP Analytical bond order potential BDT Brittle-ductile transition CMOS Complementary metal–oxide–semiconductor d Uncut chip thickness DXA Dislocation extraction algorithm Fx Tangential cutting force Fy Thrust force GB Grain boundary HPPT High pressure phase transformation MOSFET Met”
- Diamond machining of silicon: A review of advances in molecular dynamics simulation (2015, neutral): “9 2005 ABOP: analytical bond order potential [120] (3 body potential function) Si and C”
- Nanomanufacturing—Perspective and applications (2017, background): “For example, the Tersoff potential is suitable for studying the elastic property of Si, but it shows poor ability to reproduce the melting point [49,191].”