XPS depth profile analysis of non‐stoichiometric NiO films

By S. Oswald, W. Brückner. 2004

263 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/e96ef6cee69fa66f8a1cead4825f5d6740f970a8