Surface photovoltage spectroscopy of semiconductor structures: at the crossroads of physics, chemistry and electrical engineering
By Leeor Kronik, Y. Shapira. 2001
307 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Materials Chemistry, Surfaces, Coatings and Films
View Paper: https://www.semanticscholar.org/paper/e94db89cca684bc99a4a3472a1a7879a417160fa
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In Electrical and Electronic Engineering
- Elisabetta Comini
- Giorgio Sberveglieri
- M. Zha
- Andrea Zappettini
- Camilla Baratto
- R. Beranek
- Guido Faglia
- Ghenadii Korotcenkov
In Materials Chemistry
In Surfaces, Coatings and Films
Citations in the corpus
- (Photo)electrochemical Methods for the Determination of the Band Edge Positions of TiO2-Based Nanomaterials (2011, methodology): “As an alternative to the Kelvin probe technique, the surface photovoltage can be also measured directly utilizing a metal-insulator-semiconductor structure and using chopped illumination in conjunction with lock-in detection of the surface photovoltage signal [178, 179].”
- Metal oxide nanocrystals for gas sensing (2004, background): “The surface photovoltaic effect depends strongly on whether the incident photon energy is super bandgap or sub bandgap [6].”