The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing

By Tsai-Hung Fan, Narayanaswamy Balakrishnan, Chia-Chen Chang. 2009

71 citations recorded by the source corpus.

Subfields: Safety, Risk, Reliability and Quality, Software, Statistics and Probability

View Paper: https://www.semanticscholar.org/paper/e90af1839df78f6776d79d1ba45a22ec44a3fad7