Extreme temperature 6H‐SiC JFET integrated circuit technology

By P. Neudeck, S. Garverick, D. Spry, Liangyu Chen, G. Beheim, M. Krasowski, M. Mehregany. 2009

145 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/e8fd9a50c4cd60a9c9bff142ad490e27655444d6