High-resolution X-ray Diffractometry and Topography

By Zheng-wei Hu. 2000

152 citations recorded by the source corpus.

Subfields: Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/e8281a247846b8fa6653eff85844dd889e829e01

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

1. Y. Azuma
2. Michael Stock
3. P. Barat
4. G. Bartl
5. H. Bettin
6. M. Borys
7. I. Busch
8. K. Fujii

Citations in the corpus

• Improved measurement results for the Avogadro constant using a 28Si-enriched crystal (2015, background): “Moreover, no subsurface damage to the crystal could be detected by high-resolution X-ray diffractometry [7] when compared with strain free etched reference crystal surfaces.”