Probabilistic Model for the Simulation of Secondary Electron Emission

By M. Furman, M. Pivi. 2002

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We provide a detailed description of a model and its computational algorithm for the secondary electron emission process. The model is based on a broad phenomenological fit to data for the secondary emission yield (SEY) and the emitted-energy spectrum. We provide two sets of values for the parameters by fitting our model to two particular data sets, one for copper and the other one for stainless steel.

Subfields: Computational Mechanics, Electrical and Electronic Engineering, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/e7d1dbdfc4d2f1a8295a25fc5189521fe435f731