A Model-Driven Deep Neural Network for Single Image Rain Removal

By Hong Wang, Qi Xie, Qian Zhao, Deyu Meng. Computer Vision and Pattern Recognition, 2020

429 citations recorded by the source corpus.

Deep learning (DL) methods have achieved state-of-the-art performance in the task of single image rain removal. Most of current DL architectures, however, are still lack of sufficient interpretability and not fully integrated with physical structures inside general rain streaks. To this issue, in this paper, we propose a model-driven deep neural network for the task, with fully interpretable network structures. Specifically, based on the convolutional dictionary learning mechanism for representing rain, we propose a novel single image deraining model and utilize the proximal gradient descent technique to design an iterative algorithm only containing simple operators for solving the model. Such a simple implementation scheme facilitates us to unfold it into a new deep network architecture, called rain convolutional dictionary network (RCDNet), with almost every network module one-to-one corresponding to each operation involved in the algorithm. By end-to-end training the proposed RCDNet, all the rain kernels and proximal operators can be automatically extracted, faithfully characterizing the features of both rain and clean background layers, and thus naturally lead to its better deraining performance, especially in real scenarios. Comprehensive experiments substantiate the superiority of the proposed network, especially its well generality to diverse testing scenarios and good interpretability for all its modules, as compared with state-of-the-arts both visually and quantitatively.

Subfields: Computer Vision and Pattern Recognition, Safety, Risk, Reliability and Quality

View Paper: https://www.semanticscholar.org/paper/e789c737d2c374a0c4c372ff5e218ed2e86ca0ee

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Computer Vision and Pattern Recognition

  1. Vishal M. Patel
  2. Rajeev Yasarla
  3. Jin-shan Pan
  4. Jeya Maria Jose Valanarasu
  5. Boyun Li
  6. Xiaodong Cun
  7. Xueyang Fu
  8. Zhengjun Zha

In Safety, Risk, Reliability and Quality

  1. Rajeev Yasarla
  2. Vishal M. Patel

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