Composition, depth profiles and lateral distribution of materials in the SEI built on HOPG-TOF SIMS and XPS studies

By E. Peled, D. B. Tow, A. Merson, A. Gladkich, L. Burstein, Diana Golodnitsky. 2001

203 citations recorded by the source corpus.

Subfields: Computational Mechanics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/e6abdccbc54f09f253058380ae06ca110afba879