Systematic study of Ge1−xSnx absorption coefficient and refractive index for the device applications of Si-based optoelectronics

By Huong Tran, W. Du, S. Ghetmiri, A. Mosleh, Greg Sun, Richard A. Soref, J. Margetis, J. Tolle, Baohua Li, H. Naseem and 1 more. 2016

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