Phase measuring deflectometry: a new approach to measure specular free-form surfaces

By Markus Wendelin Knauer, J. Kaminski, G. Hausler. SPIE Photonics Europe, 2004

548 citations recorded by the source corpus.

Subfields: Computer Vision and Pattern Recognition, Environmental Engineering, Ocean Engineering

View Paper: https://www.semanticscholar.org/paper/e4f34eec7369e0d8a749ba480615bb489ad57d0f

Citations in the corpus

• On-machine and in-process surface metrology for precision manufacturing (2019, unknown): “Sinusoidal fringes rather than binary fringe patterns are adopted since a sinusoidal fringe does not change its phase even at a defocused position of the camera [125].”