Spatially resolved Raman spectroscopy of single- and few-layer graphene.

By D. Graf, F. Molitor, Klaus Ensslin, Christoph Stampfer, A. Jungen. Nano letters (Print), 2006

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We present Raman spectroscopy measurements on single- and few-layer graphene flakes. By using a scanning confocal approach, we collect spectral data with spatial resolution, which allows us to directly compare Raman images with scanning force micrographs. Single-layer graphene can be distinguished from double- and few-layer by the width of the D' line: the single peak for single-layer graphene splits into different peaks for the double-layer. These findings are explained using the double-resonant Raman model based on ab initio calculations of the electronic structure and of the phonon dispersion. We investigate the D line intensity and find no defects within the flake. A finite D line response originating from the edges can be attributed either to defects or to the breakdown of translational symmetry.

Subfields: Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/e414f2eb56f2cfc82589bb1d183cbf0b4643ac23

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