A small/wide-angle X-ray scattering instrument for structural characterization of air–liquid interfaces, thin films and bulk specimens

By U. Jeng, C. Su, C. Su, K. Liao, Wei‐Tsung Chuang, Y. Lai, Je-Wei Chang, Yi-Jiun Chen, Yu-Shan Huang, Ming-Tao Lee and 7 more. 2010

153 citations recorded by the source corpus.