Use of microscopic XRF for non‐destructive analysis in art and archaeometry

By K. Janssens, G. Vittiglio, I. Deraedt, A. Aerts, B. Vekemans, L. Vincze, F. Wei, I. D. Ryck, O. Schalm, F. Adams and 4 more. 2000

223 citations recorded by the source corpus.