A general accelerated life model for step-stress testing

By Wenbiao Zhao, E. Elsayed. 2005

102 citations recorded by the source corpus.

Subfields: Safety, Risk, Reliability and Quality, Statistics and Probability

View Paper: https://www.semanticscholar.org/paper/e31aadc3921349573d7a8719c28bbfa5b5dfedfc

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Safety, Risk, Reliability and Quality

1. Naijun Sha
2. Rong Pan

In Statistics and Probability

1. Naijun Sha
2. Rong Pan

Citations in the corpus

• Bayesian analysis for step-stress accelerated life testing using weibull proportional hazard model (2014, methodology): “The second SSALT data is from degradation experiments of light emitting diodes (LED) described in Zhao and Elsayed (2005).”