Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale
By Sergei V. Kalinin, Alexei Gruverman. 2016
167 citations recorded by the source corpus.
View Paper: https://www.semanticscholar.org/paper/e2b8b7994d9f2c05e8956c644e2b74b99cd2286e
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- Dewei Zhao
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Citations in the corpus
- Scanning thermal microscopy: A review (2015, background): “– Porous [62, 66, 110, 187] and mesoporous [65] bulks or thin films of submicrometric thickness [99, 152]: some results obtained with SThM were compared with values measured on the same material samples by Raman thermometry and can be in good accordance [65, 70, 187, 188].”
- Anomalously low dielectric constant of confined water (2018, unknown): “It is based on local electrostatic force detection ( 32,33 ) by using an atomic force microscope.”
- An organic-inorganic perovskite ferroelectric with large piezoelectric response (2017, background): “Because the local piezoresponse is proportional to the macroscopic d33, the prefactor for the dependence is related to the tip-sample geometry and other factors (29), which are not in the scope of this work.”