Handbook of X-Ray Spectrometry

By R. Grieken, A. Markowicz. 2002

751 citations recorded by the source corpus.

X-ray physics wavelength-dispersive X-ray fluorescence energy-dispersive x-ray flourescences data analysis quantification in XRF analysis of infinitely thick samples quantification in XRF analysis of intermediate-thickness samples radioisotope X-ray analysis synchrotron radiation X-ray emission total-reflection XRF polarized beam XRF capillary beam XRF or X-ray micro-flourescence particle-induced X-ray emission electron-induced X-ray emission sample preparation for XRF.

Subfields: Materials Chemistry, Radiation

View Paper: https://www.semanticscholar.org/paper/e2adb7c86a7740a0c02bf531056d068ffd3bb40e

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1. I. De Raedt
2. K. Janssens
3. F. Wei
4. P. van Espen
5. P. Lemberge
6. Mia Hubert
7. Peter J. Rousseeuw

Citations in the corpus

• Quantitative analysis of 16–17th century archaeological glass vessels using PLS regression of EPXMA and µ‐XRF data (2000, background): “The intensity of an element’s characteristic peak is not directly proportional to the element’s concentration; instead, it is also a function of the concentration of the other elements present in the sample [6].”