Tutorial: Understanding residual stress in polycrystalline thin films through real-time measurements and physical models

By E. Chason, Pradeep R. Guduru. 2016

200 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/e161a6e59d510f71058240b70ce6668f23e9515c