Revisiting MOSFET threshold voltage extraction methods

By Adelmo Ortiz-Conde, F. García-Sánchez, Juan Muci, Alberto Terán Barrios, J. Liou, Ching-Sung Ho. Microelectronics and reliability, 2013

318 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/e0fe6cc5e7b7841f16cbb149fd98b6e1179e5057