Atomic scale simulation of defect production in irradiated 3C-SiC

By R. Devanathan, William J. Weber, F. Gao. 2001

235 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/e0714ff48d3049453df24b1aceb5d2d7d654612d