Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor

By T. Chen, T. Chang, Tien-Yu Hsieh, Weifang Lu, Fu-Yen Jian, Chih-Tsung Tsai, Sheng-Yao Huang, Chia-Sheng Lin. 2011

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