Mechanisms of Electron-Beam-Induced Damage in Perovskite Thin Films Revealed by Cathodoluminescence Spectroscopy
By C. Xiao, Zhen Li, H. Guthrey, J. Moseley, Y. Yang, S. Wozny, H. Moutinho, B. To, J. Berry, B. Gorman and 3 more. 2015
182 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/dffde3d43769743604ae271c8d462b1d5eb7c584