Mechanisms of Electron-Beam-Induced Damage in Perovskite Thin Films Revealed by Cathodoluminescence Spectroscopy

By C. Xiao, Zhen Li, H. Guthrey, J. Moseley, Y. Yang, S. Wozny, H. Moutinho, B. To, J. Berry, B. Gorman and 3 more. 2015

182 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/dffde3d43769743604ae271c8d462b1d5eb7c584