22nm half-pitch patterning by CVD spacer self alignment double patterning (SADP)

By C. Bencher, Yongmei Chen, H. Dai, W. Montgomery, L. Huli. SPIE Advanced Lithography, 2008

141 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/dff4e7cd8afdaa22bdb62fad7e1013052fcf586b

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In Electrical and Electronic Engineering

  1. Ricardo Ruiz

In Surfaces, Coatings and Films

  1. Ricardo Ruiz

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