Measurement of the mechanical properties of electroplated gold thin films using micromachined beam structures

By Chang-Wook Baek, Yong-Kweon Kim, Y. Ahn, Y. H. Kim. 2005

149 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/df389cde224957499b1ae8ad5a84ce3d3f665542