Reduced pressure–chemical vapor deposition of Ge thick layers on Si(001) for 1.3–1.55-μm photodetection

By J. Hartmann, A. Abbadie, A. Papon, P. Holliger, G. Rolland, T. Billon, J. Fédéli, M. Rouvière, Laurent Vivien, S. Laval. 2004

227 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/ddfa8bc9dc27542ecca1373e65789ce7abe09407