A transverse rf deflecting structure for bunch length and phase space diagnostics

By R. Akre, L. Bentson, P. Emma, P. Krejcik. PACS2001. Proceedings of the 2001 Particle Accelerator Conference (Cat. No.01CH37268), 2001

176 citations recorded by the source corpus.

Subfields: Aerospace Engineering, Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/dca0cdcdc98ac0a3dd98458f858e557237a918c4

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Aerospace Engineering

1. P. Emma
2. Zhirong Huang
3. J. Welch

In Electrical and Electronic Engineering

1. P. Emma
2. Zhirong Huang
3. J. Welch

Citations in the corpus

• SwissFEL: The Swiss X-ray Free Electron Laser (2017, methodology): “The electron bunch length and current profile are measured by directly streaking the electron beam with transverse deflecting RF cavities [79], installed at suitable locations in the accelerator beamline, and observing the streaked beam with regular transverse profile monitors [80,81].”
• First lasing and operation of an ångstrom-wavelength free-electron laser (2010, methodology): “The electron bunch length is measured using a transverse RF S-band deflecting cavit”