Electric field metrology for SI traceability: Systematic measurement uncertainties in electromagnetically induced transparency in atomic vapor

By C. Holloway, M. Simons, Joshua A. Gordon, Andrew M. Dienstfrey, D. Anderson, G. Raithel. 2017

222 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics

View Paper: https://www.semanticscholar.org/paper/dbdaac192768cbc9d9141bf8dbc0bbd65b32f6e3