Estimation of long-run inefficiency levels: a dynamic frontier approach
By Seung C. Ahn, Robin C. Sickles. 2000
121 citations recorded by the source corpus.
Subfields: Economics and Econometrics, Management Science and Operations Research
View Paper: https://www.semanticscholar.org/paper/db9b0a2fa735c832e8fba4e6d8971ff8b6db1073
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Economics and Econometrics
- Camilla Mastromarco
- Léopold Simar
- Federico Belotti
- Giuseppe Ilardi
- Paul Wilson
- Cinzia Daraio
- Abdelaati Daouia
- Tom Broekel
In Management Science and Operations Research
- Camilla Mastromarco
- Léopold Simar
- Federico Belotti
- Giuseppe Ilardi
- Paul Wilson
- Cinzia Daraio
- Abdelaati Daouia
- Mika Kortelainen
Citations in the corpus
- Persistent and transient productive inefficiency: a maximum simulated likelihood approach (2015, unknown): “Ahn and Sickles (Econ Rev 19(4):461–492, 2000) suggested some approaches that pointed in this direction. The possibility was also raised in Greene (Health Econ 13(10):959–980, 2004. doi:10.1002/hec.938), who expressed some pessimism over the possibility of distinguishing the two empirically. Recentl”
- Effect of FDI and Time on Catching Up: New Insights from a Conditional Nonparametric Frontier Analysis (2015, methodology): “Hence, efficiency improvement will represent productivity catch-up via technology diffusion because inefficiencies generally reflect a sluggish adoption of new technologies (Ahn and Sickles 2000). In this paper we aim to assess the diffusion dynamics of a technology (frontier) in the countries under”
- Consistent inference in fixed-effects stochastic frontier models (2017, background): “A new generation of dynamic frontier approaches is emerging with the aim of disentan- gling the long-run from the short-run inefficiency levels (Ahn & Sickles, 2000; Tsionas, 2006; Emvalomatis, 2012).”
- Panel estimators and the identification of firm-specific efficiency levels in parametric, semiparametric and nonparametric settings (2005, unknown): “v = Qu+ ε, (6) where W is NT × L, Q = diag(Wi), i = 1, .”