Kelvin probe force microscopy and its application

By W. Melitz, Jian Shen, A. Kummel, Sangyeob Lee. 2011

1,568 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/d8c2fa35e9e76c2e3816bb90ad8899be01b2f9bb

How researchers see this paper

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In Atomic and Molecular Physics, and Optics

1. J. A. D. Silva
2. J. Gonzalez‐Julian
3. M. Bram
4. O. Guillon
5. Kerstin Neuhaus
6. A. Laptev
7. M. Bernemann

Citations in the corpus

• Unveiling the mechanisms of cold sintering of ZnO at 250 °C by varying applied stress and characterizing grain boundaries by Kelvin Probe Force Microscopy (2018, background): “On the other hand, Kelvin Probe Force Microscopy (KPFM) is a scanning probe technique that enables the observation of the topography of a sample in combination with the surface potential at a high lateral resolution [32][33][34], leading to a mapping of the local changes in defect”