The impact of technology scaling on lifetime reliability

By Jayanth Srinivasan, Sarita V. Adve, Pradip Bose, Jude A. Rivers. International Conference on Dependable Systems and Networks, 2004, 2004

615 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/d5ef88b57a992a0d09475001263176589bc8d585