Description and survey of methodologies for the determination of amorphous content via X-ray powder diffraction

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Improved cellulose X-ray diffraction analysis using Fourier series modeling (2020, methodology): “…and Welzel 2008): peak intensity analysis such as peak height method, line profile decomposition such as peak decomposition or deconvolution (Lanson 1997; Park et al. 2010; Ahvenainen et al. 2016), and line profile synthesis such as the Rietveld refinement based methods (Madsen et al. 2011).”