Fluctuation microscopy: a probe of medium range order
By M. Treacy, J. M. Gibson, L. Fan, D. Paterson, I. McNulty. 2005
182 citations recorded by the source corpus.
Subfields: Acoustics and Ultrasonics, Ceramics and Composites, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/d51351827b5706693442b486364f639ff7109d58
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In Acoustics and Ultrasonics
In Ceramics and Composites
In Materials Chemistry
Citations in the corpus
- Coherent methods in the X-ray sciences (2009, methodology): “[434], longer wavelength soft X-rays may be used to probe ordering at the scale of”
- Atomic-level structure and structure–property relationship in metallic glasses (2011, background): “Fluctuation electron microscopy (FEM) is an electron microscopy technique that is especially sensitive to medium-range (of the order of 1 nm) structural features [101,102].”