Atomic and subnanometer resolution in ambient conditions by atomic force microscopy

By Y. Gan. 2009

188 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Structural Biology

View Paper: https://www.semanticscholar.org/paper/d3dc441a674d196ddc070a863fa88b83a5b7d2ac

Citations in the corpus

• Nanomechanical mapping of soft matter by bimodal force microscopy (2013, unknown): “The atomic force microscope (AFM) [1] has significantly contributed to our current understanding of soft-matter interfaces [2–5].”