Competition between Metallic and Vacancy Defect Conductive Filaments in a CH3NH3PbI3-Based Memory Device

By Yiming Sun, Meiqian Tai, C. Song, Ziyu Wang, Jun Yin, Fangsen Li, Huaqiang Wu, Fei Zeng, Hong Lin, F. Pan. 2018

141 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Polymers and Plastics

View Paper: https://www.semanticscholar.org/paper/d3807ed80571b1351b8abd2f9c6d4d43eae65539