Advances in Yield Calibration of Scintillators

By J. D. Haas, Pieter Dorenbos. IEEE Transactions on Nuclear Science, 2008

196 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Radiation, Radiology, Nuclear Medicine and Imaging

View Paper: https://www.semanticscholar.org/paper/d2db9f518de93c21a0ea072bf54c71bfbcb00208

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

1. Martin Janecek
2. Pieter Dorenbos

In Radiation

1. Martin Janecek
2. Pieter Dorenbos

In Radiology, Nuclear Medicine and Imaging

1. Martin Janecek
2. Pieter Dorenbos

Citations in the corpus

• Reflectivity Spectra for Commonly Used Reflectors (2012, background): “emissions located between 375 and 480 nm [1-6].”
• Fundamental Limitations in the Performance of ${\rm Ce}^{3+}$ –, ${\rm Pr}^{3+}$ –, and ${\rm Eu}^{2+}$ –Activated Scintillators (2010, methodology): “Also new methods to measure the absolute scintillation yield were introduced by De Haas et al. [ 17 ].”