Aberration correction by maximizing generalized sharpness metrics.

By James R. Fienup, J. Miller. Journal of The Optical Society of America A-optics Image Science and Vision, 2003

305 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Computer Vision and Pattern Recognition, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/d2d5a1ebbbf421514fe3aef359e935660be7ea5c

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

  1. Byoungho Lee

In Electrical and Electronic Engineering

  1. Byoungho Lee
  2. Ole Bang
  3. L. Rindorf

Citations in the corpus