Behavior of oxygen doped SiC thin films: An x-ray photoelectron spectroscopy study

By A. Ávila, I. Montero, L. Galán, J. M. Ripalda, R. Levy. 2001

153 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

View Paper: https://www.semanticscholar.org/paper/d16cb0de2e8f1f7403ef4428fbf6cd43e01ecd86

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1. P. Chahal
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Citations in the corpus

• Selective Fabrication of SiC/Si Diodes by Excimer Laser Under Ambient Conditions (2016, background): “The oxy carbide phases might have formed on the surface of film as the film was exposed to atmosphere [16], [17].”