Defect passivation and homogenization of amorphous oxide thin-film transistor by wet O2 annealing

By K. Nomura, T. Kamiya, H. Ohta, M. Hirano, Hideo Hosono. 2008

299 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry, Polymers and Plastics

View Paper: https://www.semanticscholar.org/paper/cf5aad8306d4aa3c6abd28b24b5e7b8fa043244c