Direct Force Measurements and Kinking under Elastic Deformation of Individual Multiwalled Boron Nitride Nanotubes

By Dmitri Golberg, P. Costa, O. Lourie, M. Mitome, X. Bai, K. Kurashima, Chunyi Zhi, Chengchun Tang, Yoshio Bando. 2007

205 citations recorded by the source corpus.

Subfields: Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/ce775c69c353a422501c1d507f05e800b9e44332

How researchers see this paper

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In Materials Chemistry

1. Dmitri Golberg
2. Yoshio Bando
3. Chunyi Zhi
4. Chengchun Tang
5. Xiaosheng Fang
6. Teng Zhai
7. U. Gautam
8. Liang Li

Citations in the corpus

• Advances in AFM for the electrical characterization of semiconductors (2008, background): “Such systems, which are now commercially available [221], are currently being used for the investigation of the changes occurring in the sample and/or tip during force–displacement measurements [221, 222], rather than to allow simultaneous SPM and TEM imaging, which has not yet (to our knowledge) be”
• Boron nitride nanotubes and nanosheets. (2010, background): “In fact, many taken TEM images of multiwalled BNNT cross sections have displayed more or less faceted-like shapes.(36) The diverse cross sections of BNNTs are related to the different growth conditions, which also determine the wall thicknesses and tube diameters.”