Pull-in analysis of electrically actuated viscoelastic microbeams based on a modified couple stress theory
164 citations recorded by the source corpus.
View Paper: https://www.semanticscholar.org/paper/ce75b31ffe1cc2705d6b7cb443e75c67fbb101ee
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- Farzad Ebrahimi
- Ö. Civalek
- Bekir Akgöz
- Mama Ahouel
- Ismahene Belkorissat
- Mohammed Sid Ahmed Houari
- E. A. Adda Bedia
- Ali Farajpour
Citations in the corpus
- Modeling and analysis of micro-sized plates resting on elastic medium using the modified couple stress theory (2013, methodology): “Recently, some new applications have been performed using the strain gradient elasticity and couple stress theory [26–32].”
- On vibration properties of functionally graded nano-plate using a new nonlocal refined four variable model (2015, background): “…alloy thin films with a global thickness in micro- or nano-scale (Fu et al. 2003, Witvrouw and Mehta 2005, Lü et al. 2009), electrically actuated MEMS devices (Hasanyan et al. 2008, Mohammadi-Alasti et al. 2011, Zhang and Fu 2012), and atomic force microscopes (AFMs) (Rahaeifard et al. 2009).”
- Analytical solutions for bending and buckling of functionally graded nanobeams based on the nonlocal Timoshenko beam theory (2013, unknown): “All rights reserved.”
- Size-dependent mechanical behavior of functionally graded trigonometric shear deformable nanobeams including neutral surface position concept (2016, background): “…and nano-electromechanical systems (MEMS and NEMS) (Witvrouw and Mehta 2005, Lee et al. 2006, Hasanyan et al. 2008, Mohammadi-Alasti et al. 2011, Zhang and Fu 2012), thin films in the form of shape memory alloys (Fu et al. 2003, Lu et al. 2011), and atomic force microscopes (AFMs) to achieve…”
- Buckling analysis of arbitrary two-directional functionally graded Euler–Bernoulli nano-beams based on nonlocal elasticity theory (2016, background): “…(MEMS/NEMS), for example in the form of shape memory alloy thin films with a global thickness in micro- or nano-scale ( Lü, Lim, & Chen, 2009b ), electrically actuated MEMS devices ( Zhang & Fu, 2012 ), and atomic force microscopes (AFMs) ( Kahrobaiyan, Asghari, Rahaeifard, & Ahmadian, 2010 ).”