Metal precipitation at grain boundaries in silicon: Dependence on grain boundary character and dislocation decoration

By Tonio Buonassisi, A. A. Istratov, Matthew D. Pickett, M. Marcus, T. Ciszek, E. Weber. 2006

136 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/ce6362f8b0de26e09f2d385dff0c734858490beb