Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy

By Andrei Kholkin, Sergei V. Kalinin, A. Roelofs, Alexei Gruverman. 2007

149 citations recorded by the source corpus.

Subfields: Biomedical Engineering, Materials Chemistry, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/ce59f23386468e84658c6a7dc6d2d4f491989395

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Biomedical Engineering

1. V. Shvartsman
2. M. Raschke
3. Andrei Kholkin

In Materials Chemistry

1. V. Shvartsman
2. Andrei Kholkin

Citations in the corpus

• Nano-optical imaging and spectroscopy of order, phases, and domains in complex solids (2012, methodology): “The scanning probe technique of piezoresponse force microscopy (PFM) can reveal nanoscale information on surface FE domain configurations [415,416], by monitoring piezoelectric surface displacements induced by the electrically biased probe tip [417–420].”
• Doping strategies for increased performance in BiFeO3 (2009, background): “8), pointing to the weak contribution of the electrostatic signal [37].”