X-ray Diffraction Study of the Ultrathin Al2O3 Layer on NiAl(110)

By Andreas Stierle, F. Renner, R. Streitel, Helmut Dosch, W. Drube, B. Cowie. Science, 2004

144 citations recorded by the source corpus.

Subfields: Aerospace Engineering, Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/cddfa237d380798201849022200e928f7d7e5c34

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. A. Lozovoi
2. Ali Alavi
3. P. Elleaume
4. D. Bilderback
5. M. Finnis
6. E. Weckert

In Materials Chemistry

1. Alexander V. Shapeev
2. Evgeny V. Podryabinkin

Citations in the corpus

• Review of third and next generation synchrotron light sources (2005, background): “In another example, the accurate geometric structure of an Al2O3 oxide layer on a NiAl alloy was determined with implications as to how this type of layer can serve as a template for model catalysts, tunnelling barriers in electronic devices or a model corrosion-resistant layer (Stierle et al 2004).”
• THE OXIDATION OF NIAL: What Can We Learn from Ab Initio Calculations? (2005, result): “Some experimental data suggest it is γ -Al2O3 (25, 67), although according to a very recent study (68), κ-Al2O3 reproduces experimental results even better.”