Structure Evolution During Processing of Polycrystalline Films

By Carl V. Thompson. 2000

820 citations recorded by the source corpus.

Subfields: Electronic, Optical and Magnetic Materials, Materials Chemistry, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/cd7bc08318f7478a6ad4b6ea7f83728b53d4e9f4

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electronic, Optical and Magnetic Materials

1. Nanshu Lu
2. Ghenadii Korotcenkov
3. Zhigang Suo
4. J. Vlassak

In Materials Chemistry

1. Nanshu Lu
2. Zhigang Suo
3. B. Cho
4. Ghenadii Korotcenkov
5. Vladimir Brinzari
6. J. Vlassak
7. Jian Zhu

In Mechanics of Materials

1. Nanshu Lu
2. J. Vlassak
3. Zhigang Suo
4. Ghenadii Korotcenkov

Citations in the corpus

• The effect of film thickness on the failure strain of polymer-supported metal films (2010, background): “It is well known that the crystallographic texture of a film varies with film thickness as a result of a trade-off between interfacial energy and strain energy [32].”
• Grain Size Effects in Sensor Response of Nanostructured SnO2- and In2O3-Based Conductometric Thin Film Gas Sensor (2009, background): “Studies by Thompson Mazzone and Sun 122 , 123 , 124 reported that there were two main reasons for the grain growth observed during thermal treatments.”