A review on modern defect detection models using DCNNs – Deep convolutional neural networks

By Andrei-Alexandru Tulbure, Adrian-Alexandru Tulbure, Eva-Henrietta Dulf. Journal of Advanced Research, 2021

309 citations recorded by the source corpus.

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Subfields: Computer Vision and Pattern Recognition, Electrical and Electronic Engineering, Industrial and Manufacturing Engineering

View Paper: https://www.semanticscholar.org/paper/cc4c8b3ef52594f996807e85c01831ceae7ba8ed