Characterization of SiO2 and TiO2 films prepared using rf magnetron sputtering and their application to anti-reflection coating

By S. Jeong, Jae-Keun Kim, Bong-Soo Kim, Seok-Ho Shim, Byung-Teak Lee. 2004

202 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry, Renewable Energy, Sustainability and the Environment

View Paper: https://www.semanticscholar.org/paper/cae47524bca164ff689bc07e137d27b0fc0b5b1e