Developing self‐mixing interferometry for instrumentation and measurements

By Silvano Donati. 2012

348 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/c99f282c95b2cc2e5137baa4aaf232ebd949810f

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Guofeng Zhang
2. Shuming Yang
3. G. Berkovic
4. E. Shafir

Citations in the corpus

• Optical methods for distance and displacement measurements (2012, background): “This approach first appeared 15–20 years ago [103,104], and comprehensive reviews of this field have been published [105,106].”
• A review of interferometry for geometric measurement (2018, background): “A low-cost and compact diode laser [93] is usually used as the source of the SMI, which is due to the fact [94, 95] that any reflection coming from the object will modulate the laser output when it re-enters the diode cavity.”