Rapid Characterization of Ultrathin Layers of Chalcogenides on SiO2/Si Substrates

By D. Late, Bin Liu, H. Matte, C. Rao, V. Dravid. 2012

466 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/c948ddf37b7e8d04bfe90a4566965cf5f41e8085

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Yi Cui
2. A. Castellanos-Gómez
3. Ju Li
4. D. Late
5. J. Shan
6. Joshua E. Goldberger
7. T. Heinz
8. Sayeef Salahuddin

In Materials Chemistry

1. A. Castellanos-Gómez
2. G. Steele
3. Herre S. J. van der Zant
4. M. Buscema
5. Mauricio Terrones
6. J. Shan
7. T. Heinz
8. Yi Cui

Citations in the corpus

• Progress, challenges, and opportunities in two-dimensional materials beyond graphene. (2013, background): “for initially identifying single- and multiple-layer flakes.(20,58,122,123) Dielectric-coated SiO2/Si substrates are the most common substrates used to visualize”
• The effect of the substrate on the Raman and photoluminescence emission of single-layer MoS2 (2013, background): “In this section, we extend the model used in Refs [33], [30-32] to also include the effect of optical iterference at the typical PL emission wavelengths of MoS2 laying on a multi-layered substrate.”
• Sensing behavior of atomically thin-layered MoS2 transistors. (2013, methodology): “9 nm (Figure 1d), which is consistent with previous reports.(26,47) For 2 5 layers of MoS2, the measured thicknesses were approximately 1.”